原子力顯微鏡
產(chǎn)品名稱： 原子力顯微鏡
英文名稱： AFM
產(chǎn)品編號(hào)： DP-AFM
產(chǎn)品價(jià)格： 0
產(chǎn)品產(chǎn)地： 德國(guó)
品牌商標(biāo)： 德國(guó)
更新時(shí)間： null
使用范圍： null
雙極科技（香港）公司
- 聯(lián)系人 :
- 地址 : 北京海淀區(qū)東北旺南路29號(hào)3-3
- 郵編 :
- 所在區(qū)域 : 北京
- 電話 : 137****5113 點(diǎn)擊查看
- 傳真 : 點(diǎn)擊查看
- 郵箱 : DUALPOLAR@163.COM
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Our Level AFM offers a wide Spectrum of Measurement Methods:
- High Resolution Dynamic & Contact Mode
? - Current-AFM Mode
? - Lateral Force Mode
- Force Spectroscopy
? - Kelvin Probe Force Microscopy
? - Magnetic Force Microscopy
? - Electrical Force Microscopy
? - Nano-Lithography with script-language
? - Elastic Force Microscopy (Force Modulation Mode)
SYSTEM PARAMETERS:
lateral resolution: < 1 nm (practical resolution)
technical resolution: 0.19 nm (18 bit achieved technical resolution)
mathematical resolution: 32 Bit (< 0.1 pm)
height resolution: < 150 pm noise floor in DNC (atomic steps and layers)
technical resolution: 0.026 nm (18 bit achieved technical resolution)
maximum scan range: 50 mm (standard, others possible on request), z-range: 6 μm
maximum sample size: 4 cm x 6 cm
manual positioning range: 5 mm x 5 mm
accessories: 15 cantilevers; 1 calibration grating UMG01
20 sample holders; 2 sample boxes, tweezers
OPTIONAL FEATURES (NOT NECESSARY FOR STANDARD APPLICATIONS):
1.Vibration isolation table under the microscope
2.Hardware scanner linearisation
3.Glass bell jar for acoustic protection
4.Additional cantilever packages and gratings
5.enhanced LFM mode sensitivity due to a spot-like laser diode
6.additional LockIn amplifier for dynamic EFM or MFM
7.implemented Kelvin feedback
8.current amplifier for conductance AFM incl. power supply
SPIP – Scanning Probe Image Processor - with all costumer specific modules from Imaging
Metrology
9. 2nd TFT monitor
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